Abstract

In this paper, the authors present and discuss a model for Cu-Se nano resonant tunneling diodes (RTDs) fabricated by negative template assisted electrodeposition technique and formulate the mathematical equations for it. The model successfully explains the experimental findings.

Highlights

  • For nanoelectronics to become a reality one must be able to fabricate the devices and circuits at nanometer dimensions

  • We have developed a model for these resonant tunneling diodes (RTDs)

  • Experimental Cu-Se RTDs have been fabricated by electrodepositing Cu and Se in the pores of the polycarbonate track-etch membranes (PC TEMs) [3,4]. (PC TEMs) with pores of diameters 1 μm, 100 nm and 40 nm were used for this purpose

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Summary

Introduction

For nanoelectronics to become a reality one must be able to fabricate the devices and circuits at nanometer dimensions. SEM view of Cu-Se RTD of diameter 1 μm in back-scattering mode is shown in the Figure 2. This mode is used to obtain the contrast image of the object. Experimental results of I-V characteristics of Cu-Se binary structures of diameters 2 μm, 1 μm, 100 nm and 40 nm are shown in Figures 4 and 5.

Experimental
A Model for Cu-Se RTDs
Theoretical Analysis of Experimental Results
Increase in Cut-In Voltage
Tunneling Current
Conclusions
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