Abstract
Proposed MIL-STD-883 Test Procedure 5012, 'Fault Coverage Measurement for Digital Microcircuits', is described. Numerous fault simulation tools are commercially available; this procedure provides a means of obtaining consistent and repeatable fault coverage values from different fault simulators. The procedure describes requirements governing the development of the logic model for the IC, the assumed fault model and fault universe, fault classing, fault simulation, and fault coverage reporting. It provides a consistent means of reporting fault coverage for an IC regardless of the specific logic and fault simulator used. >
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