Abstract
A microwave free space reflectometry technique with swept frequency measurements for the profiling of wall structures and the detection of hidden (covered) layers has been applied to the Hagia Sophia byzantine monument. Experimental measurement results are presented and compared with three-dimensional (3D) simulated results, exhibiting fair agreement in some (though not all) aspects. Based on the experimental results, the possibility of clear discrimination between regions with and without covered mosaic layers, and hence the detection of such layers, is demonstrated.
Highlights
The in-depth characterization of wall structures is of considerable interest for monument conservation and restoration [1]
Varying the frequency between 8–12 GHz, results for the reflection coefficient amplitude were first obtained for a reference two-layer configuration, setting d2 = 0, as plotted in Figure 4, by 3D and plane wave simulation
Simulations; the finite directivity the combined with limited scattering considered for thethe finite directivity of thehorn hornantenna, antenna, combined withthe the limited scatteringsurface surface considered for this seems to be confirmed by the increase of the reflection coefficient given by the
Summary
The in-depth characterization of wall structures is of considerable interest for monument conservation and restoration [1]. The detection of successive layers of different materials may reveal hidden architectural or decorative elements of historical and/or artistic significance To this end, the identification of the geometry and electric properties (complex dielectric permittivities) of stratified media is desirable, since the walls of many monuments may be modeled as multilayered planar (or nearly planar) structures. The relevant literature is quite large; a good portion of earlier publications is reviewed in References [2,3,4], while a comprehensive selection of more recent pertinent work may be found in References [5,6] Such methods are based on reflection or reflection-transmission measurements, with the materials under test being usually in stratified geometries. Reflectometry (or interferometry) techniques are Computation 2018, 6, 12; doi:10.3390/computation6010012 www.mdpi.com/journal/computation
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