Abstract
A microscope system based on bevel-axial method auto-focus (BAM-AFS) is proposed. The purpose is to establish an auto-focus microscope system that calculates the focus position one or many times. In this paper, we propose a bevel-axial method that had an included angle between CCD sensor and image plane with multi-parameters fusing from image to obtain the in-focus position directly in the first phase and combined Kalman estimate to obtain the in-focus position for different objects in the second phase. We discuss the relation between focus positions and image focus at the end.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.