Abstract
A microcontroller-based noncontact and nondestructive microwave free-space measurement system for real-time and dynamic determination of complex permittivity of lossy liquid materials has been proposed. The system is comprised of two main sections--microwave and electronic. While the microwave section provides for measuring only the amplitudes of reflection coefficients, the electronic section processes these data and determines the complex permittivity using a general purpose microcontroller. The proposed method eliminates elaborate liquid sample holder preparation and only requires microwave components to perform reflection measurements from one side of the holder. In addition, it explicitly determines the permittivity of lossy liquid samples from reflection measurements at different frequencies without any knowledge on sample thickness. In order to reduce systematic errors in the system, we propose a simple calibration technique, which employs simple and readily available standards. The measurement system can be a good candidate for industrial-based applications.
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