Abstract
A new method of decreasing the errors in measurements of the coordinates of objects through quantization of signals in opto-electronic devices with multi-element radiation detectors is considered. Using certain relationships between the pixel pitch of the elements in the detector and the image width, it is shown that if the illuminance of the image of an object is distributed uniformly, the systematic component of this error is equal to zero and its random component depends on the scatter of the pixel pitch of the elements.
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