Abstract
The RC-IGBT is integrated IGBT and fast recovery diode (FRD) on the same chip. RC-IGBT has smaller size, higher power density, lower cost, and higher reliability. However, due to the snap-back effect, the traditional test circuit and method cannot accurately measure the thermal resistance of RC-IGBT. In this paper, a thermal resistance test circuit based on series compensation of two devices is proposed, and the voltage drop Vec of the body diode is taken as the temperature sensitive parameter of RC-IGBT. The thermal response curve is obtained basing on the change of Vec with temperature. By comparing the traditional method with the new method, it can be seen that the new method can greatly improve the test accuracy.
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