Abstract
A method has been developed for finding the half-intensity width, to an accuracy of ±5%, of the profiles of spectral lines photographed in the vacuum ultraviolet. Plate calibration is achieved by an aperture restriction device placed at the Sirks focus of a 3-meter normal incidence vacuum spectrograph. This gives a stepped intensity in the focal plane with a standard ratio of 2:1. The measurement is not affected by reciprocity law failure or intermittency effect in the photographic emulsion, and can be used with pulsed light sources.
Full Text 
Sign-in/Register to access full text options
Sign-in/Register to access full text options 
Published version (
Free)
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
