Abstract
This brief presents a low-power high-stability scan driver integrated by In–Zn–O (IZO) TFTs on polyimide substrate. Observed from the experimental results of the scan driver with 48 stages, there is no distortion and good noise-suppressed characteristics for the output waveforms. In one stage of the proposed scan driver, there only needs a small TFT connected to clock signals by using a feedback inverter and a dc output module to minimize the dynamic power consumption. It is measured that the power consumption for one stage of the proposed gate driver is 18.3 $\mu \text{W}$ at the output swing of 15.3 V and the clock frequency of 50 kHz. There is a good noise-suppressed characteristic and high stability for the proposed scan driver as shown from a 300-h test.
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