Abstract
Jitter decomposition is a key tool to identify root causes of jitters in a high-speed digital communication system. It is a huge challenge in balancing the test cost and precision for conventional decomposition methods implemented in instruments where the time interval error (TIE) data are necessary. In this paper, we propose a deterministic jitter decomposition method using Boolean output from a network of simple low-cost comparators to identify the deviation of current sampling position from the ideal sampling position instead of TIE data. The new method simultaneously separates intersymbol interference (ISI), periodic jitter (PJ), and duty cycle distortion (DCD). Simulation and measurement results demonstrate that the proposed method can estimate the ISI, PJ, and DCD with sufficient accuracy using significantly fewer data samples than the state-of-the-art instrument test, and thus, reduce test cost greatly. Furthermore, the comparators have extremely relaxed design requirements, offering potential for possible on-chip implementation for built-in self-test or background test.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
More From: IEEE Transactions on Electromagnetic Compatibility
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.