Abstract
Silicon bolometers at temperatures in the range of 280–450 mK with and without a thin copper absorber were tested for use as detectors in high-resolution RBS analysis. For this purpose RBS measurements were done on cooled Ta-Cr-Si samples with 200 keV light ions (H, He, B). Energy resolutions of better than 8 keV FWHM were achieved which were more than a factor of 3 better than previously reported bolometric measurements on charged particles. Specific problems of RBS measurements with bolometers and further improvements of the energy resolution are discussed.
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