Abstract
We have developed a system which extracts near-infrared video information from a conventional absorption imaging system based around a vidicon camera. This information is processed to give EL2 concentration ([EL2]) scans on selected lines from an absorption image, using a point calibration from a spectro-photometer. In addition, the system can be used to calculate the mean deviation of [EL2] fluctuations. This mean deviation is used to measure the microscopic uniformity of [EL2] in commercial material The system is demonstrated by assessment of “quenched” material. This material has been annealed at high temperatures (>1100°C), and then raapidly cooled to room temperature. Subsequently some of this material has been conventionally annealed at 950°C followed by a slow cool. Quenched and annealed material is shown to have excellent [EL2] uniformity compared with conventional as-grown or annealed material.
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