Abstract
A simple “lift-off” technique was developed for fabricating sharp step edges without ion milling. Atomic force microscopy showed a sharp step edge of an angle about 60°. The Tc's of the step-edge junctions were 88–90 K, independent of film thickness. The I–V curves were RSJ-like and clear Shapiro steps were observed. IcRn products from 140 μV to 320 μV were obtained at 77 K.
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