Abstract
A knowledge-based method for obtaining sequential wavelength-dispersive X-ray fluorescence intensities is proposed. The method aims at maximum precision in minimal time. Time reduction is established by measuring only relevant spectral regions. These regions are identified by on-line interpretation of the measured data. For identification and quantification a curve fit procedure is used. Curve fitting makes it possible to determine peak heights with less sampling points than in traditional methods. The feasibility of the strategy is shown by means of an off-line version based on premeasured X-ray spectra.
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