Abstract
Today's high-density integrated circuits (ICs) have become more sensitive to temperature, process variations and environmental noises. This makes their reliability evaluation one of critical issues in the design flow. Circuit reliability evaluation generally requires estimation of error-free signal probabilities and signal reliability correlations. In this paper, we present a fast hybrid method to estimate both signal probability and reliability simultaneously by using combination of analysis and statistical simulation. Simulation results show that the proposed method is hundreds of times faster than Monte-Carlo simulation, while maintaining a high level of accuracy.
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