Abstract

A two-step high-precision Time-to-Digital Converter(TDC), integrated with a Single-Photon Avalanche Diode(SPAD), used for Time-Of-Flight(TOF) application, has been developed and tested. Time interval measurement is performed by the coarse counter and fine interpolator, which are utilized to measure the total periods and the residue time of the reference clock, respectively. Following a detail analysis of time precision and clock jitter in the two-step structure, the prototype TDC fabricated in GSMC 1P6M 0.18 µm CMOS Image Sensor(CIS) technology exhibits a Single-Shot Precision(SSP) of 11.415 ps and a dynamic range of 216.7 ns. In addition, a pixel of the chip occupies 100 μm×100 μm, and the measured Integral Nonlinearity(INL) and Differential Nonlinearity(DNL) are better than ±0.88 LSB and ±0.67 LSB, respectively. Meanwhile, the overall power consumption of the chip is 35 mW at 1.8 V power supply. Combined with these characteristics, the designed chip is suitable for TOF-based ranging applications.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.