Abstract

We have designed and experimentally verified a test bench for high frequency testingof rapid single-flux-quantum (RSFQ) circuits. This test bench uses an externaltunable clock signal that is stable in amplitude, phase and frequency. The highfrequency external clock reads out the clock pattern stored in a long shift register.The clock pattern is consequently shifted out at high speed and split to feedboth the circuit under test and an additional shift register in the test bench forlater verification at low speed. This method can be employed for reliable highspeed verification of RSFQ circuit operation, with use of only low speed read-outelectronics. The test bench consists of 158 Josephson junctions and the occupied area is3300 × 660 µm2. It was experimentally verified up to 33 GHz with ± 21.7% margins on the global bias supply current.

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