Abstract
A general approach is presented for calculating the aperture admittance of a rectangular waveguide radiating into layered dielectric media. The two specific geometries of stratified, lossy dielectric media that are addressed terminate into either an infinite half-space or a perfectly conducting surface. The geometries describe two prevalent categories of layered dielectric composites and coatings that often are encountered in practical microwave nondestructive evaluation applications. Solutions are found initially by constructing a complete set of field components and subsequently enforcing the continuity of power flow across the aperture interface of the waveguide. Final results are presented as a superposition of transverse electric and magnetic components of the aperture admittance. The solutions presented allow the systematic calculation of admittance in the presence of arbitrary multilayer media, which in turn may be related to experimentaly measurable quantities of interest. With the practical assumption of dominant mode incidence on the aperture, the final expressions may be implemented without intense computational power, which often is desirable in practice where inaccuracies due to random errors and instrumentation sensitivity render incorporation of more rigorous solutions inefficient. Numerically simulated data also are presented to verify and interpret the results.
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