A Fully Synthesizable Fractional-N Digital Phase-Locked Loop with a Calibrated Dual-Referenced Interpolating Time-to-Digital Converter to Compensate for Process–Voltage–Temperature Variations

Abstract

This paper presents advancements in the performance of digital phase-locked loop (DPLL)s, with a special focus on addressing the issue of required gain calibration in the time-to-digital converter (TDC) within phase-domain DPLL structures. Phase-domain DPLLs are preferred for their simplicity in implementation and for eliminating the delta–sigma modulator (DSM) noise inherent in conventional fractional-N designs. However, this advantage is countered by the critical need to calibrate the gain of the TDC. The previously proposed dual-interpolated TDC(DI-TDC) was proposed as a solution to this problem, but strong spurs were still generated due to the TDC resolution, which easily became non-uniform due to PVT variation, degrading performance. To overcome these problems, this work proposes a DPLL with a new calibration system that ensures consistent TDC resolution matching the period of the digitally controlled oscillator (DCO) and operating in both the foreground and background, thereby maintaining consistent performance despite PVT variations. This study proposes a DPLL using a calibrated dual-interpolated TDC that effectively compensates for PVT variations and improves the stability and performance of the DPLL. The PLL was fabricated in a 28-nm CMOS process with an active area of only 0.019 mm2, achieving an integrated phase noise (IPN) performance of −17.5 dBc, integrated from 10 kHz to 10 MHz at a PLL output of 570 MHz and −20.5 dBc at 1.1 GHz. This PLL operates within an output frequency range of 475 MHz to 1.1 GHz. Under typical operating conditions, it consumes only 930 µW with a 1.0 V supply.