Abstract
It is shown that the well-known linear variation of p–n diode terminal voltage with temperature at different fixed forward currents allows easy and accurate determination of the semiconductor ideality factor and bandgap from only two data points. This is possible if the temperature difference required to maintain the same diode voltage drop can be measured. The results for silicon and germanium bandgap energy using this approach are in excellent agreement with the literature. The method therefore provides a fresh and original insight into the derivation of the bandgap using data from a popular experiment. The experiment is suitable for undergraduate laboratories on semiconductors.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
