Abstract
This paper presents a follow-up of the results of an 8-year study on radiation effects in commercial off the shelf (COTS) memory devices operating within the on-board data handling system of the Algerian micro-satellite Alsat-1 in a Low-Earth Orbit (LEO). A statistical analysis of single-event upset (SEU) and multiple-bit upset (MBU) activity in commercial memories on-board the Alsat-1 primary On-Board Computer (OBC-386) is given. The OBC-386 is an Intel 80C386EX based system that plays a dual role for Alsat-1, acting as the key component of the payload computer as well as the command and control computer for the micro-satellite. The in-orbit observations show that the typical SEU rate at Alsat-1’s orbit is 4.04 × 10 −7 SEU/bit/day, where 98.6% of these SEUs cause single-bit errors, 1.22% cause double-byte errors, and the remaining SEUs result in multiple-bit and severe errors.
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