Abstract
Several chips composed of ten quantum Hall effect (QHE) devices placed in series by triple connections have been fabricated. The results obtained on one of these first arrays of quantized Hall resistances (QHR) open the possibility to realize novel QHR standards. The QHR on the i=2 plateau, 10/spl times/R/sub H/(i=2), was compared to R/sub H/(i=2) from a standard type QHE sample acting as a reference. The comparison results agreed to within parts in 10/sup 9/ for the measurements of a 1000 /spl Omega/ standard resistance. This work followed preliminary tests on the multiple connection techniques. In particular, the QHR on the i=2 plateau of a special QHE sample allowing the auto-series configuration with a double connection was found equal to 2/spl times/R/sub H/(i=2) within the total standard uncertainty of 4.4 parts in 10/sup 9/.
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