Abstract

A variable-gain time-to-digital converter (TDC)-based multiplying delay-locked loop (MDLL) clock multiplier featuring fast-locking and programmable N/M-ratio frequency multiplication capability is presented in this paper. The proposed all-digital programmable N/M-ratio MDLL achieves fast-locking capability by adopting a new variable-gain TDC. In conventional fixed-gain TDC-based MDLLs, the lock time increases as the value of the multiplication factor N decreases. However, the proposed variable-gain TDC can minimize the MDLL lock time by adjusting the TDC gain according to the change in N value. Implemented in a 40 nm 1.1-V CMOS process, the proposed all-digital MDLL clock multiplier generates output clock frequencies ranging from 0.65 to 3.2 GHz, with programmable N/M ratios of N = 5 to 16 and M = 1 to 8. It achieves a fast lock time of only 3 × M (=9) reference clock cycles when N/M = 10/3 at 2.0 GHz and demonstrates a simulated peak-to-peak jitter of 3.16 ps at 3.2 GHz when N/M = 16/3. Additionally, it occupies an active area of only 0.02 mm2 (=200 μm × 100 μm) and consumes a power of 2.3 mW at 1.0 GHz.

Full Text
Published version (Free)

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call