Abstract
For single-crystal electron-diffraction studies requiring definition of the location of the microscope goniometer tilt axis with respect to the diffraction pattern orientation, a quick calibration can be made taking advantage of the methylene O⊥ (001) subcell diffraction pattern obtained from any of a certain series of isostructural long-chain compounds when they are tilted 30° about the monoclinic b* axis. Those crystals giving a symmetric O⊥ (001) diffraction pattern when the stage is tilted 30° have their b* axes parallel to the tilt axis.
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