Abstract
This paper presents a PUF (physical unclonable functions) authentication mechanism which can combat aging based on restrict race code (RRC). PUF provide a mechanism for identifying an integrated circuit based on the intrinsic variations of physical components uniquely and provide a cheap and secure alternative to random message storage on devices. However, due to its own characteristics, the chip-level PUF circuit reliability is easily affected by environment. The effect of reversible temporal noise on PUF is well studied and has obtained good effect (e.g. temperature, voltage), but sufficient attention has not been given so far to analyze the effect of the irreversible temporal variabilities (e.g. aging on PUF). This paper proposes a dynamic PUF authentication method, which is based on the RRC with two-ring strong characteristics structure. A combination of hardware and software system is used to improve the efficiency of authentication, and in an FPGA (field-programmable gate array)-based SRAM (static random access memory) PUF are used as an experimental object to verify the feasibility of this design. And this system can enhance the authentication system safety from the CVC (characteristic value challenge) randomness test.
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