Abstract
The basic elements of an electron diffraction camera—a source of high velocity monochromatic electrons, a magnetic focusing lens, and a recording photographic system—are found in the magnetic electron microscope. This has naturally led to the development of a diffraction adapter1 for electron microscopes which has proved most useful for supplementing electron micrographs with data on specimen composition. A specimen holder for an adapter lens to the Model B RCA electron microscope is here described. It is designed to accommodate a wide range of specimen sizes and shapes for diffraction investigations by both electron reflection and transmission methods. Three completely independent motions of the specimen are provided, namely: (1) translation in a direction perpendicular to the electron beam, (2) rotation about the direction of translation, and (3) rotation about an axis perpendicular to both the electron beam and the direction of translation.
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