Abstract
This paper presents an electronic circuit system that is capable of measuringdielectric Q-factor Qx (= 1/tan δ) ranging from 0.01-10 at measuring frequencies 100 kHz-30 MHz, and from 10-105 at 1-300 MHz. For measurement of very high loss materials, a tripartite differential capacitor is used as a variable resistor to substitute for low Rx, and for measurement of very low loss materials, an ordinary differential capacitor connected in series with two fixed deposited fim resistors is used to substitute for high unknown resistance Rx. An important characteristic of the circuit is its capability of measuring capacitance and resistance of high loss materials accurately.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: IEEE Transactions on Instrumentation and Measurement
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
