Abstract
Both von Neumann’s NAND multiplexing, based on a massive duplication ofimperfect devices and randomized imperfect interconnects, and reconfigurablearchitectures have been investigated to come up with solutions for integrations ofhighly unreliable nanometre-scale devices. In this paper, we review these twotechniques, and present a defect- and fault-tolerant architecture in which vonNeumann’s NAND multiplexing is combined with a massively reconfigurablearchitecture. The system performance of this architecture is evaluated by studyingits reliability, i.e. the probability of system survival. Our evaluation showsthat the suggested architecture can tolerate a device error rate of up to10−2,with multiple redundant components; the structure is efficiently robust againstboth permanent and transient faults for an ultra-large integration of highlyunreliable nanometre-scale devices.
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