Abstract
Interior of Czochralski-grown (Lu,Y)AG:Pr crystals has been examined by means of several techniques, such as X-Ray Photoelectron Spectroscopy, X-Ray Diffraction, Time-of-Flight Secondary Ion Mass Spectrometry, and magnetic susceptibility measurements. Additionally, their luminescence has been monitored at various combinations of a double-beam (X-ray/IR) excitation.
Highlights
Mixed (Lu,Y)AG:Pr crystals have already been recognized as promising fast and efficient scintillator materials. Compared to their prototype LuAG:Pr they offer higher light outputs and increased contributions of the prompt component to their scintillation time profiles at an expense of a somewhat lower density [1,2]. In this Communication we provide additional data on the internal structure of Czochralski-grown (Lu,Y)AG:Pr crystals, as well as on some trap-related aspects of their scintillation mechanism
There is only a single weak line attributed to none of the above-mentioned elements. It is the C 1s line at 285 eV, arising in X-Ray Photoelectron Spectroscopy (XPS) of most samples due to their surface contamination with trace amounts of C, which is useful for calibration purposes [5]
The internal structure research generally confirms a high quality of the grown (Lu,Y)AG:Pr crystals
Summary
Mixed (Lu,Y)AG:Pr crystals have already been recognized as promising fast and efficient scintillator materials Compared to their prototype LuAG:Pr they offer higher light outputs and increased contributions of the prompt component to their scintillation time profiles at an expense of a somewhat lower density [1,2]. In this Communication we provide additional data on the internal structure of Czochralski-grown (Lu,Y)AG:Pr crystals, as well as on some trap-related aspects of their scintillation mechanism. Cryogenics closed-cycle He cooler with a Lake Shore 330 temperature controller
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