Abstract
A novel dielectric resonator operating at cryogenic temperatures (14–85 K)at a frequency of 10 GHz for measurements of permittivity and loss tangentof dielectric substrates for HTS microwave circuits is presented. We havefabricated a prototype post dielectric resonator, with superconducting(DyBa2Cu3O7) end plates and silver-plated copper sidewalls to improve the sensitivity andresolution of loss tangent measurements. Also a numerical technique forcalculations of permittivity and loss tangent from the resonant frequency and theQ-factor is presented in the paper. For verification of the technique, measurements of the realpart of the permittivity of a single crystal quartz substrate have been performed and a verygood agreement with published data using the whispering gallery mode technique has beenobtained.
Published Version
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