A coupling method for rapid, continuous and extremely wide-temperature measurement of total hemispherical emissivity and conversion efficiency of the kinetic energy of an electron beam to the thermal energy of a material based on a scanning electron beam

Abstract

Precise measurements of a material's total hemispherical emissivity and conversion efficiency of the Kinetic energy of an Electron beam to the Thermal energy of a Material (KETM) are crucial for the advancement of new materials and electron beam applications. We propose a coupling method for the rapid and continuous measurements of the above parameters across an extremely broad temperature range, the basic idea of which is that a thin plate sample is uniformly heated to a high-temperature state by a scanning electron beam and naturally cooled, and equations of the transient heat transfer process in the cooling section and the heating section are solved separately based on the assumption of the lumped heat capacity, and the above parameters varying with temperature are obtained in turn. The characterization experiments of the wire-drawn and polished 304 stainless steel are carried out. The emissivities of two surface states increase monotonically in the ranges of [0.17(400K), 0.26(954K)] and [0.12(400K), 0.20(983K)], respectively, aligning well with trends and values reported in the literature. Oxidation on both surfaces worsens as the preset temperature rises, resulting in a corresponding increase in the emissivity. Considering the impact of oxidation on emissivity, KETM is calculated in various regions within the considered temperature ranges. The results indicate a slight variation around 0.819 in KETMs of wire-drawn and polished 304 stainless steel within the temperature range of 400∼1000 K, aligning well with the value reported in the literature. This efficient measurement method can provide potential support for the application of the above two parameters.