Abstract
The electrical, thermal, and multiple-stress (thermal and electrical) aging of cross-linked polyethylene (XLPE) cable models has been investigated in order to get information on aging effects and mechanisms. After endurance tests, XLPE cable models have been subjected to chemical, physical, electrical, and microstructural characterization. Thermal aging results reveal that bulk degradation occurs in the cables at temperatures higher than the melting point. Multiple-stress aging data emphasize a synergistic effect of electric field and temperature. Significant microstructural changes detected in the cables aged under multiple stress are evidence of this effect and can partly explain the time behavior of the electric strength.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
Published Version
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