Abstract

The spinel nano ferrite with elemental composition Ni0.3Cu0.3Zn0.4Fe2O4 and CTAB-coated Ni0.3Cu0.3Zn0.4Fe2O4was prepared using the co-precipitation method. The modification in microstructural, magnetic, and dielectric properties was recorded by X-ray diffraction (XRD), Vibrating Sample Magnetometer (VSM), and Impedance Spectroscopy. The X-ray diffraction pattern with a prominent (311) plane confirms spinel ferrite with space group Fd-3m. Additionally, the intensity ranges from 569-1797cps and the 2θ position is between 35.571°-35.626°, indicating a more ordered structure of spinel ferrite with CTAB. The modification in the structural parameter was observed through crystallite size(18-25nm), strain (6.240x10-3-4.383x10-3), dislocation density (3.023x1015-1.496x10151/m2), packing factor (72.113-102.746), lattice dimension (8.3638-8.3433A°), stacking fault (0.448-0.446), X-ray density (5.417-5.457 g/cm3), experimental density (2.861-3.253 g/cm3), specific surface area (60.90 x103 -42.53 x103 m2/g) and % porosity (47.18-40.38). Additionally, this research explores the relationship between magnetic properties and X-ray diffraction analysis. Interionic distances (p, q, r, s, b, c, d, e, f) and bond angles (θ1, θ2, θ3, θ4, and θ5) were calculated to determine A-A, A-B, and B-B interactions for all samples. The recorded strong vibrations within the range of 400-600 cm-1 using FTIR confirm the presence of the Fe-O functional group of spinel ferrite in all the materials that were prepared. The smooth magnetic isotherm (M-H loop) with coercivity (165.661-75.231Oe), magnetic saturation (41.469-61.880 emu/g), retentivity (9.730-5.526 emu/g), magnetic anisotropy (7010-4398 erg/cm3) and magnetic moment (1.770-2.6420μB) corresponds to elevation in spin-orbit interaction, noncollinear arrangement of surface spins and spin canting in the sublattice respectively. The squareness ratio in the range of 0.217-0.096 indicates that the prepared nano ferrite is of a pseudo-single domain nature and suitable for Multilayer Chip Inductor (MLCI) application.

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