Abstract
The analog–mixed signal simulation environment, used for verifying non-volatile memory macrocells, is presented. It has been adopted over the last decade, providing excellent results in verification coverage, efficiency, and flexibility. This methodology ensures a smooth and effective transition from full transistor/fully analog simulations to fully digital simulations while maintaining most of the environment’s features. This allows verification designers to exchange data, stimuli, and results, thereby enhancing debugging capabilities and reducing simulation time.
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