Abstract
We present a simple method for complete determination of the x-ray polarization state, using just one Bragg reflection from a single-crystal analyzer. For the linear polarization components P1 and P2, we show that the usual method of using a 90° Bragg reflection can be extended to using any Bragg reflection with 2θ≠90°. For circular component P3, we use the intensity modulation profile in an azimuthal rotation caused by the phase-sensitive interference around a multiple-beam Bragg reflection. The combination of the two measurements allows a straightforward complete determination of x-ray polarization, including an unpolarized component, in a broad applicable energy range.
Published Version
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