A comparison study of electroluminescence from Au/native oxide/p-Si and Au/porous Si diodes

Abstract

Visible electroluminescence (EL) has been observed from a Au/native oxide/p-Si diode and has been studied in comparison with the EL from a Au/porous Si diode. Both diodes share similarities in current-voltage characteristics, EL spectra, and electrical input power dependence of integrated EL intensity. However, Au/porous Si exhibits quite strong photoluminescence (PL) while Au/native oxide/p-Si does not show any measurable PL. For the Au/native oxide/p-Si diode, when the native oxide layer was removed in 1% HF solution, no detectable EL has been observed. These experimental results indicate that the native oxide layer plays a key role in light emission from the Au/native oxide/p-Si diode, and show that the luminescence mechanism for Au/native oxide/p-Si diodes is similar to that for the Au/porous Si diode. This comparative study may aid in elucidation of the EL mechanism of porous silicon.