Abstract
ABSTRACTA comparative study of two techniques to analyze double screen frequency selective surface (FSS) is presented. The FSS are composed with perfectly conducting rectangular patch elements. Numerical and experimental results are presented. The two techniques are the scattering matrix (SM) and the spectral domain analysis. The study allowed us to set up main advantages and constraints of these techniques and define which one should be used for particular FSS geometries and conditions. © 2013 Wiley Periodicals, Inc. Microwave Opt Technol Lett 55:2206–2209, 2013
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