Abstract
This paper presents a numerical investigation for a double screen frequency selective surface (FSS) with perfectly conducting rectangular patch elements. The analysis uses a full wave technique to obtain the scattering characteristics. The analysis combines the immitance approach and the method of moments to obtain the scattered fields and, consequently, the scattering characteristics of the structure. For validation of the analysis, numerical results are compared with measured and numerical results presented by another authors. A good agreement was obtained with experimental results.
Highlights
Frequency selective surfaces (FSS) have a large number of applications that contribute significantly to improving the performance of communications circuits
In [15] the authors use the spectral domain analysis to obtain the scattering characteristics for a single layer FSS and, after this, they use an approximated technique to combine the responses of the single layer FSS to obtain the scattering parameters for a double screen FSS
We propose the use of the spectral domain analysis that combine the immitance approach and the method of moments to obtain the scattering characteristics for double screen FSS structures
Summary
Frequency selective surfaces (FSS) have a large number of applications that contribute significantly to improving the performance of communications circuits. In [13], the authors proposed a Fabry Perot Interferometer approach to obtain the scattering characteristics of a double screen FSS for TM incidence This is an approximate analysis and produces good results when compared with measurements. We propose the use of the spectral domain analysis that combine the immitance approach and the method of moments to obtain the scattering characteristics for double screen FSS structures. The advantage of this technique is that it allows obtain more accurate results when compared with approximated techniques. We analyze the double screen FSS using the spectral domain analysis
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