Abstract
Secondary ion yields, secondary ion-energy spectra and ion-scattering spectra for high-T c superconducting compound YBa2Cu 3-y Al y O x have been studied as a function of Al content (y=0–0.8). In accordance with data known from literature, it was shown by Secondary-Ion Mass Spectrometry (SIMS) that Al doping of YBaCuO results in the selective substitution of Cu1 atoms with Al atoms. The correlated non-monotonic variations of the secondary-ion yield, the most probable secondary ion energy and the scattered ion yield for Y and Ba were observed with a growth of Al concentration and were explained in terms of the modification of local composition and electronic structure in the vicinity of these atoms. The kinetics of secondary-ion emission during sputtering of the original surface layer degraded under air exposure has also been measured for the YBaCuAlO samples. It was found that the ion currents ratio Ba+/BaOH+ may characterize the level of degradation and the oxygen concentration in Cu1–O layers,
Published Version
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call