A colloid-SEM method for the study of fine magnetic domain structures

Abstract

A simple method to obtain fine magnetic domain patterns is described. The method has two processes, the first is to make the usual Bitter patterns and the second to observe dried colloidal particles on domain boundaries by a scanning electron microscope (SEM) in the secondary electron mode. Micrographs of domain patterns of hexagonal cobalt have been shown at magnifications of SEM from 2000 to 5000. Owing to the large focal depth of SEM, it is able to observe domains on both surfaces of a crystal edge at the same time, and examples have been shown.