Abstract
The magnetic force microscope (MFM) has the potential of enabling observations of fine magnetic domain structures, but remaining problems must be resolved before practical application is possible. As a result of theoretical analysis, the most suitable values of the probe-sample distance h and probe radius R were found to be h = 600 Å and R = 100 Å. Using these values, an MFM cantilever of length 130 μm, width 10 μm and thickness 1 μm was designed. A scanning tunneling microscope (STM) was used to detect the cantilever displacement resulting from the magnetic force. A new domain configuration was observed by scanning electron microscopy (SEM) by bringing a sharp Fe wire tip close to a sample and observing the influence of the leakage field of the tip.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
