Abstract
Statistical process control techniques have been widely used to improve processes by reducing variations and defects. In the present paper, we propose a multivariate control chart technique based on a clustering algorithm that can effectively handle a situation in which the distribution of in-control observations is inhomogeneous. A simulation study was conducted to examine the characteristics of the proposed control chart and to compare them with Hotelling’s T 2 multivariate control charts that are widely used in real-world processes. Moreover, an experiment with real data from the thin film transistor liquid crystal display (TFT-LCD) manufacturing process demonstrated the effectiveness and accuracy of the proposed control chart.
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