A Boundary Scan Test Vectors Optimization Method Based on Improved GA-AO* Approach Considering Fault Probability Model

Yuanzhang Su, Zhen Liu + Show 3 more

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https://doi.org/10.3390/app14062410

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Journal: Applied Sciences	Publication Date: Mar 13, 2024
License type: cc-by

Abstract

A Boundary Scan Test Vectors Optimization Method Based on Improved GA-AO* Approach Considering Fault Probability Model

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