Abstract
The author addresses the need for adapted design and test tools when using boundary scan in board-level circuit design and testing these assemblies. Test pattern generation is dealt with, the data flow around this generation software is discussed, and a format for test vectors is presented. Details are given for different approaches to test pattern generation, and a program for checking correctness of vectors is introduced. Also, a PC-based BST (boundary scan testing) validation tool capable of addressing the first needs of a designer is described. It is concluded that, although using BST pays off very rapidly, a lot of details in the total design and test trajectory have to be cleared up. Coupling between tools and availability of software capable of dealing with BST according to a selected strategy are items that have to be checked. >
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
