Abstract
Built-in-self test (BIST) for VLSI systems is desirable in order to reduce the cost per chip of production-time testing by the manufacturer. In addition, it can provide the means to perform in-the-field diagnostics. This paper discusses a mixed analog-digital BIST (MADBIST) for a signal-to-noise-ratio test, gain tracking test, and frequency response test of a sigma-delta analog-to-digital converter. The MADBIST strategy for the SNR, GT, and FR tests of the ADC is introduced, accuracy issues are discussed, and experimental results are presented.< <ETX xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">></ETX>
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