Abstract
A 9 b Successive-Approximation-Register (SAR) Anglog-to-Digital Converter (ADC) with pilot-Digital-to-Analog Converter (pDAC) technique for image sensor applications is described in this paper. Its Forward Error Correction (FEC) improves its robustness against device mismatch. It performs mixed-signal Correlated-Double-Sampling (CDS) using only the ADC's built-in capacitor array without any additional amplifier or memory. The ADC measures 490μm×7.4μm and is demonstrated in a low-power CMOS image sensors with column parallel ADCs. Measurement results from the prototype image sensor in 0.18 μm technology shows that the ADC's Differential Non-Linearity (DNL) is reduced from 3.5 LSB to 1.2 LSB by its mixed-signal FEC algorithm, making its Figure-of-Merit (FoM) 64 fJ/step. Furthermore, when combined with the ADC's mixed-signal Correlated-Double-Sampling, the column FPN is reduced from 3.2% to 0.5% without any additional circuit.
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