A 6-Bit 20 GS/s Time-Interleaved Two-Step Flash ADC in 40 nm CMOS

Abstract

A 6-bit 20 GS/s 16-channel time-interleaved (TI) analog-to-digital converter (ADC) using a two-step flash ADC with a sample-and-hold (S/H) sharing technique and a gain-boosted voltage-to-time converter (VTC) is presented for high-speed wireline communication systems. By sharing one S/H between coarse and fine stages in the two-step flash ADC, the input bandwidth as well as area and power efficiency can be improved without a gain error between coarse and fine ADCs. Thanks to an eight-time interpolation using the gain-boosted VTC, the fine ADC has a small gate capacitance without a speed penalty, even in a small input voltage range. A prototype ADC implemented in a 40 nm CMOS process occupies a 0.1 mm2 active area. The measured differential non-linearity (DNL) and integral non-linearity (INL) after offset and gain calibrations were 0.45 and 0.39 least significant bit (LSB), respectively. With a 9.042 GHz input, the measured signal-to-noise and distortion ratio (SNDR) and the spurious-free dynamic range (SFDR) were 30.12 and 40.23 dB, respectively. The small input capacitance of the sub-ADC enables a power-efficient track-and-hold amplifier (THA), resulting in a power consumption of 56.2 mW under a supply voltage of 0.9 V. The prototype ADC achieves a figure of merit (FoM) of 107.4 fJ/conversion-step at 20 GS/s.