Abstract
The well-tested method of measuring β-spectra with Si(Li) semiconductor detectors in 4 π geometry is extended to inner β −-spectra and positron decays by applying coincidence techniques. For this purpose a 4 π β- γ-coincidence spectrometer has been constructed. The radioactive source and the two 2 π Si(Li) β-detectors are put together in a sandwichlike arrangement. The γ-quanta, emitted in coincidence with the β-particles, are detected by two large NaI(Tl) scintillation counters, which cover a solid angle of 0.6 × 4 π with respect to the source. A sluice enables the source to be quickly brought into the vacuum chamber, so that short-lived decays with halflives down to one minute can be measured. The characteristics of the coincidence spectrometer are checked by measuring the β −-spectrum of 24Na and the positron spectrum of 22Na. The results are in good agreement with those obtained by other methods and show the reliability of the apparatus.
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