Abstract
Phase shifting profilometry has been commonly used in three-dimensional shape measurement with the advantages of high-precision and non-contact. However, it is still challenging to measure high-reflective surface because image saturation will lead to absolute phase errors and reconstruction errors. In this paper, a dual-view multi-intensity projection method was proposed. Compared with the single-view method, the proposed method can reconstruct more points at each projection intensity especially for pixels around the specular angle and reduce the number of projections to reduce the time consumption. First, we established the dual-view structured light system consisting of two monocular systems that share the same projector. Subsequently, a dual-view saturated pixel judging method was proposed that enables the reconstruction results under two views to be combined without duplicate points. The multi-intensity projection method was adopted by reducing the input projection intensity step by step and reconstructing the remaining pixels around the specular angle. Finally, the reconstruction result can be obtained by stitching point clouds at each projection intensity. Experiments verified that the proposed method could improve the integrity of reconstructed point clouds and measurement efficiency.
Published Version
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