Abstract

A 22–30-GHz gallium nitride (GaN) low-noise amplifier (LNA) having a noise figure (NF) of 0.4–1.1 dB is presented in this letter. This LNA is fabricated with 0.1 gate-length GaN-on-silicon high-electron mobility transistor process, which is believed to have the lowest NF among GaN LNA at this frequency range reported to date. The small-signal gain is between 19.5 and 22.5 dB across the band. The output-referred 1-dB compression point (P1dB) and output-referred third-order intercept point (OIP3) are at 20.8- and 34.5-dBm level. The high robust was proven by stressing the LNA with a continuous wave input power of 30 dBm for 1 min. The three-stage LNA is $1.7\times1.3$ mm2 in area and consumes 210-mW dc power. Compared with the traditional gallium arsenide and indium phosphide LNA, the GaN monolithic microwave integrated circuit LNA in this letter exhibits a competitive NF but has much higher robust and linearity.

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